| Product Description |
Chapman Instruments MP 2000 non-contact surface profiling system.
Specifications:
Viewing System for high definition visual inspection
Non-contact scanning line profiles
Non-contact 3D Scans
0.5µm lateral resolution
Scan lengths ranging from microns to 100mm
Automated sample positioning X,Y, theta
Includes ULWD MSPlan 20. This system has not been tested.
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